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authorDaniel Baumann <daniel.baumann@progress-linux.org>2024-05-08 03:43:31 +0000
committerDaniel Baumann <daniel.baumann@progress-linux.org>2024-05-08 03:43:31 +0000
commit1327913aeadf5737e7ebf158f93632d6df2eba1d (patch)
tree2ca5c2a3aa381788eca2580f72a2d5c60934b28a /Documentation/ABI/testing/sysfs-bus-iio
parentAdding upstream version 4.19.260. (diff)
downloadlinux-1327913aeadf5737e7ebf158f93632d6df2eba1d.tar.xz
linux-1327913aeadf5737e7ebf158f93632d6df2eba1d.zip
Adding upstream version 4.19.269.upstream/4.19.269
Signed-off-by: Daniel Baumann <daniel.baumann@progress-linux.org>
Diffstat (limited to 'Documentation/ABI/testing/sysfs-bus-iio')
-rw-r--r--Documentation/ABI/testing/sysfs-bus-iio2
1 files changed, 1 insertions, 1 deletions
diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio
index d10bcca6c..b3adbb33a 100644
--- a/Documentation/ABI/testing/sysfs-bus-iio
+++ b/Documentation/ABI/testing/sysfs-bus-iio
@@ -135,7 +135,7 @@ Description:
Raw capacitance measurement from channel Y. Units after
application of scale and offset are nanofarads.
-What: /sys/.../iio:deviceX/in_capacitanceY-in_capacitanceZ_raw
+What: /sys/.../iio:deviceX/in_capacitanceY-capacitanceZ_raw
KernelVersion: 3.2
Contact: linux-iio@vger.kernel.org
Description: