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| author | Daniel Baumann <daniel.baumann@progress-linux.org> | 2024-05-08 03:43:31 +0000 |
|---|---|---|
| committer | Daniel Baumann <daniel.baumann@progress-linux.org> | 2024-05-08 03:43:31 +0000 |
| commit | 1327913aeadf5737e7ebf158f93632d6df2eba1d (patch) | |
| tree | 2ca5c2a3aa381788eca2580f72a2d5c60934b28a /Documentation/ABI/testing | |
| parent | Adding upstream version 4.19.260. (diff) | |
| download | linux-1327913aeadf5737e7ebf158f93632d6df2eba1d.tar.xz linux-1327913aeadf5737e7ebf158f93632d6df2eba1d.zip | |
Adding upstream version 4.19.269.upstream/4.19.269
Signed-off-by: Daniel Baumann <daniel.baumann@progress-linux.org>
Diffstat (limited to '')
| -rw-r--r-- | Documentation/ABI/testing/sysfs-bus-iio | 2 |
1 files changed, 1 insertions, 1 deletions
diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio index d10bcca6c..b3adbb33a 100644 --- a/Documentation/ABI/testing/sysfs-bus-iio +++ b/Documentation/ABI/testing/sysfs-bus-iio @@ -135,7 +135,7 @@ Description: Raw capacitance measurement from channel Y. Units after application of scale and offset are nanofarads. -What: /sys/.../iio:deviceX/in_capacitanceY-in_capacitanceZ_raw +What: /sys/.../iio:deviceX/in_capacitanceY-capacitanceZ_raw KernelVersion: 3.2 Contact: linux-iio@vger.kernel.org Description: |