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| author | Daniel Baumann <daniel.baumann@progress-linux.org> | 2024-05-08 03:43:39 +0000 |
|---|---|---|
| committer | Daniel Baumann <daniel.baumann@progress-linux.org> | 2024-05-08 03:43:39 +0000 |
| commit | 27a2c36c9538c7e5536a1b20fd74f0fc911d7950 (patch) | |
| tree | 3101221cb1458bce62f7ae76638517d93f8b64a8 /Documentation/ABI/testing | |
| parent | Releasing progress-linux version 4.19.260-1progress5u1. (diff) | |
| download | linux-27a2c36c9538c7e5536a1b20fd74f0fc911d7950.tar.xz linux-27a2c36c9538c7e5536a1b20fd74f0fc911d7950.zip | |
Merging upstream version 4.19.269.
Signed-off-by: Daniel Baumann <daniel.baumann@progress-linux.org>
Diffstat (limited to 'Documentation/ABI/testing')
| -rw-r--r-- | Documentation/ABI/testing/sysfs-bus-iio | 2 |
1 files changed, 1 insertions, 1 deletions
diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio index d10bcca6c..b3adbb33a 100644 --- a/Documentation/ABI/testing/sysfs-bus-iio +++ b/Documentation/ABI/testing/sysfs-bus-iio @@ -135,7 +135,7 @@ Description: Raw capacitance measurement from channel Y. Units after application of scale and offset are nanofarads. -What: /sys/.../iio:deviceX/in_capacitanceY-in_capacitanceZ_raw +What: /sys/.../iio:deviceX/in_capacitanceY-capacitanceZ_raw KernelVersion: 3.2 Contact: linux-iio@vger.kernel.org Description: |