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authorDaniel Baumann <daniel.baumann@progress-linux.org>2024-05-06 03:01:46 +0000
committerDaniel Baumann <daniel.baumann@progress-linux.org>2024-05-06 03:01:46 +0000
commitf8fe689a81f906d1b91bb3220acde2a4ecb14c5b (patch)
tree26484e9d7e2c67806c2d1760196ff01aaa858e8c /src/VBox/ValidationKit/utils/usb/UsbTest.cpp
parentInitial commit. (diff)
downloadvirtualbox-f8fe689a81f906d1b91bb3220acde2a4ecb14c5b.tar.xz
virtualbox-f8fe689a81f906d1b91bb3220acde2a4ecb14c5b.zip
Adding upstream version 6.0.4-dfsg.upstream/6.0.4-dfsgupstream
Signed-off-by: Daniel Baumann <daniel.baumann@progress-linux.org>
Diffstat (limited to 'src/VBox/ValidationKit/utils/usb/UsbTest.cpp')
-rw-r--r--src/VBox/ValidationKit/utils/usb/UsbTest.cpp658
1 files changed, 658 insertions, 0 deletions
diff --git a/src/VBox/ValidationKit/utils/usb/UsbTest.cpp b/src/VBox/ValidationKit/utils/usb/UsbTest.cpp
new file mode 100644
index 00000000..bc13e1e0
--- /dev/null
+++ b/src/VBox/ValidationKit/utils/usb/UsbTest.cpp
@@ -0,0 +1,658 @@
+/* $Id: UsbTest.cpp $ */
+/** @file
+ * UsbTest - User frontend for the Linux usbtest USB test and benchmarking module.
+ * Integrates with our test framework for nice outputs.
+ */
+
+/*
+ * Copyright (C) 2014-2019 Oracle Corporation
+ *
+ * This file is part of VirtualBox Open Source Edition (OSE), as
+ * available from http://www.virtualbox.org. This file is free software;
+ * you can redistribute it and/or modify it under the terms of the GNU
+ * General Public License (GPL) as published by the Free Software
+ * Foundation, in version 2 as it comes in the "COPYING" file of the
+ * VirtualBox OSE distribution. VirtualBox OSE is distributed in the
+ * hope that it will be useful, but WITHOUT ANY WARRANTY of any kind.
+ *
+ * The contents of this file may alternatively be used under the terms
+ * of the Common Development and Distribution License Version 1.0
+ * (CDDL) only, as it comes in the "COPYING.CDDL" file of the
+ * VirtualBox OSE distribution, in which case the provisions of the
+ * CDDL are applicable instead of those of the GPL.
+ *
+ * You may elect to license modified versions of this file under the
+ * terms and conditions of either the GPL or the CDDL or both.
+ */
+
+
+/*********************************************************************************************************************************
+* Header Files *
+*********************************************************************************************************************************/
+#include <iprt/dir.h>
+#include <iprt/err.h>
+#include <iprt/file.h>
+#include <iprt/getopt.h>
+#include <iprt/path.h>
+#include <iprt/param.h>
+#include <iprt/process.h>
+#include <iprt/stream.h>
+#include <iprt/string.h>
+#include <iprt/test.h>
+
+#include <iprt/linux/sysfs.h>
+
+#include <unistd.h>
+#include <errno.h>
+#include <limits.h>
+
+#include <sys/types.h>
+#include <sys/stat.h>
+#include <fcntl.h>
+
+#include <sys/ioctl.h>
+#include <linux/usbdevice_fs.h>
+
+
+/*********************************************************************************************************************************
+* Defined Constants And Macros *
+*********************************************************************************************************************************/
+
+
+/*********************************************************************************************************************************
+* Structures and Typedefs *
+*********************************************************************************************************************************/
+
+/**
+ * USB test request data.
+ * There is no public header with this information so we define it ourself here.
+ */
+typedef struct USBTESTPARMS
+{
+ /** Specifies the test to run. */
+ uint32_t idxTest;
+ /** How many iterations the test should be executed. */
+ uint32_t cIterations;
+ /** Size of the data packets. */
+ uint32_t cbData;
+ /** Size of */
+ uint32_t cbVariation;
+ /** Length of the S/G list for the test. */
+ uint32_t cSgLength;
+ /** Returned time data after completing the test. */
+ struct timeval TimeTest;
+} USBTESTPARAMS;
+/** Pointer to a test parameter structure. */
+typedef USBTESTPARAMS *PUSBTESTPARAMS;
+
+/**
+ * USB device descriptor. Used to search for the test device based
+ * on the vendor and product id.
+ */
+#pragma pack(1)
+typedef struct USBDEVDESC
+{
+ uint8_t bLength;
+ uint8_t bDescriptorType;
+ uint16_t bcdUSB;
+ uint8_t bDeviceClass;
+ uint8_t bDeviceSubClass;
+ uint8_t bDeviceProtocol;
+ uint8_t bMaxPacketSize0;
+ uint16_t idVendor;
+ uint16_t idProduct;
+ uint16_t bcdDevice;
+ uint8_t iManufacturer;
+ uint8_t iProduct;
+ uint8_t iSerialNumber;
+ uint8_t bNumConfigurations;
+} USBDEVDESC;
+#pragma pack()
+
+#define USBTEST_REQUEST _IOWR('U', 100, USBTESTPARMS)
+
+/**
+ * Callback to set up the test parameters for a specific test.
+ *
+ * @returns IPRT status code.
+ * @retval VINF_SUCCESS if setting the parameters up succeeded. Any other error code
+ * otherwise indicating the kind of error.
+ * @param idxTest The test index.
+ * @param pszTest Test name.
+ * @param pParams The USB test parameters to set up.
+ */
+typedef DECLCALLBACK(int) FNUSBTESTPARAMSSETUP(unsigned idxTest, const char *pszTest, PUSBTESTPARAMS pParams);
+/** Pointer to a USB test parameters setup callback. */
+typedef FNUSBTESTPARAMSSETUP *PFNUSBTESTPARAMSSETUP;
+
+/**
+ * USB test descriptor.
+ */
+typedef struct USBTESTDESC
+{
+ /** (Sort of) Descriptive test name. */
+ const char *pszName;
+ /** Flag whether the test is excluded. */
+ bool fExcluded;
+ /** The parameter setup callback. */
+ PFNUSBTESTPARAMSSETUP pfnParamsSetup;
+} USBTESTDESC;
+/** Pointer a USB test descriptor. */
+typedef USBTESTDESC *PUSBTESTDESC;
+
+/**
+ * USB speed values.
+ */
+typedef enum USBTESTSPEED
+{
+ USBTESTSPEED_ANY = 0,
+ USBTESTSPEED_UNKNOWN,
+ USBTESTSPEED_LOW,
+ USBTESTSPEED_FULL,
+ USBTESTSPEED_HIGH,
+ USBTESTSPEED_SUPER
+} USBTESTSPEED;
+
+
+/*********************************************************************************************************************************
+* Global Variables *
+*********************************************************************************************************************************/
+
+/** Some forward method declarations. */
+static DECLCALLBACK(int) usbTestParamsSetupReadWrite(unsigned idxTest, const char *pszTest, PUSBTESTPARAMS pParams);
+static DECLCALLBACK(int) usbTestParamsSetupControlWrites(unsigned idxTest, const char *pszTest, PUSBTESTPARAMS pParams);
+
+/** Command line parameters */
+static const RTGETOPTDEF g_aCmdOptions[] =
+{
+ {"--device", 'd', RTGETOPT_REQ_STRING },
+ {"--help", 'h', RTGETOPT_REQ_NOTHING},
+ {"--exclude", 'e', RTGETOPT_REQ_UINT32},
+ {"--exclude-all", 'a', RTGETOPT_REQ_NOTHING},
+ {"--include", 'i', RTGETOPT_REQ_UINT32},
+ {"--expected-speed", 's', RTGETOPT_REQ_STRING }
+};
+
+static USBTESTDESC g_aTests[] =
+{
+ /* pszTest fExcluded pfnParamsSetup */
+ {"NOP", false, usbTestParamsSetupReadWrite},
+ {"Non-queued Bulk write", false, usbTestParamsSetupReadWrite},
+ {"Non-queued Bulk read", false, usbTestParamsSetupReadWrite},
+ {"Non-queued Bulk write variabe size", false, usbTestParamsSetupReadWrite},
+ {"Non-queued Bulk read variabe size", false, usbTestParamsSetupReadWrite},
+ {"Queued Bulk write", false, usbTestParamsSetupReadWrite},
+ {"Queued Bulk read", false, usbTestParamsSetupReadWrite},
+ {"Queued Bulk write variabe size", false, usbTestParamsSetupReadWrite},
+ {"Queued Bulk read variabe size", false, usbTestParamsSetupReadWrite},
+ {"Chapter 9 Control Test", false, usbTestParamsSetupReadWrite},
+ {"Queued control messaging", false, usbTestParamsSetupReadWrite},
+ {"Unlink reads", false, usbTestParamsSetupReadWrite},
+ {"Unlink writes", false, usbTestParamsSetupReadWrite},
+ {"Set/Clear halts", false, usbTestParamsSetupReadWrite},
+ {"Control writes", false, usbTestParamsSetupControlWrites},
+ {"Isochronous write", false, usbTestParamsSetupReadWrite},
+ {"Isochronous read", false, usbTestParamsSetupReadWrite},
+ {"Bulk write unaligned (DMA)", false, usbTestParamsSetupReadWrite},
+ {"Bulk read unaligned (DMA)", false, usbTestParamsSetupReadWrite},
+ {"Bulk write unaligned (no DMA)", false, usbTestParamsSetupReadWrite},
+ {"Bulk read unaligned (no DMA)", false, usbTestParamsSetupReadWrite},
+ {"Control writes unaligned", false, usbTestParamsSetupControlWrites},
+ {"Isochronous write unaligned", false, usbTestParamsSetupReadWrite},
+ {"Isochronous read unaligned", false, usbTestParamsSetupReadWrite},
+ {"Unlink queued Bulk", false, usbTestParamsSetupReadWrite}
+};
+
+/** The test handle. */
+static RTTEST g_hTest;
+/** The expected device speed. */
+static USBTESTSPEED g_enmSpeed = USBTESTSPEED_ANY;
+
+/**
+ * Setup callback for basic read/write (bulk, isochronous) tests.
+ *
+ * @copydoc FNUSBTESTPARAMSSETUP
+ */
+static DECLCALLBACK(int) usbTestParamsSetupReadWrite(unsigned idxTest, const char *pszTest, PUSBTESTPARAMS pParams)
+{
+ NOREF(idxTest);
+ NOREF(pszTest);
+
+ pParams->cIterations = 1000;
+ pParams->cbData = 512;
+ pParams->cbVariation = 512;
+ pParams->cSgLength = 32;
+
+ return VINF_SUCCESS;
+}
+
+/**
+ * Setup callback for the control writes test.
+ *
+ * @copydoc FNUSBTESTPARAMSSETUP
+ */
+static DECLCALLBACK(int) usbTestParamsSetupControlWrites(unsigned idxTest, const char *pszTest, PUSBTESTPARAMS pParams)
+{
+ NOREF(idxTest);
+ NOREF(pszTest);
+
+ pParams->cIterations = 1000;
+ pParams->cbData = 512;
+ /*
+ * Must be smaller than cbData or the parameter check in the usbtest module fails,
+ * no idea yet why it must be this.
+ */
+ pParams->cbVariation = 256;
+ pParams->cSgLength = 32;
+
+ return VINF_SUCCESS;
+}
+
+/**
+ * Shows tool usage text.
+ */
+static void usbTestUsage(PRTSTREAM pStrm)
+{
+ char szExec[RTPATH_MAX];
+ RTStrmPrintf(pStrm, "usage: %s [options]\n",
+ RTPathFilename(RTProcGetExecutablePath(szExec, sizeof(szExec))));
+ RTStrmPrintf(pStrm, "\n");
+ RTStrmPrintf(pStrm, "options: \n");
+
+
+ for (unsigned i = 0; i < RT_ELEMENTS(g_aCmdOptions); i++)
+ {
+ const char *pszHelp;
+ switch (g_aCmdOptions[i].iShort)
+ {
+ case 'h':
+ pszHelp = "Displays this help and exit";
+ break;
+ case 'd':
+ pszHelp = "Use the specified test device";
+ break;
+ case 'e':
+ pszHelp = "Exclude the given test id from the list";
+ break;
+ case 'a':
+ pszHelp = "Exclude all tests from the list (useful to enable single tests later with --include)";
+ break;
+ case 'i':
+ pszHelp = "Include the given test id in the list";
+ break;
+ case 's':
+ pszHelp = "The device speed to expect";
+ break;
+ default:
+ pszHelp = "Option undocumented";
+ break;
+ }
+ char szOpt[256];
+ RTStrPrintf(szOpt, sizeof(szOpt), "%s, -%c", g_aCmdOptions[i].pszLong, g_aCmdOptions[i].iShort);
+ RTStrmPrintf(pStrm, " %-30s%s\n", szOpt, pszHelp);
+ }
+}
+
+/**
+ * Searches for a USB test device and returns the bus and device ID and the device speed.
+ */
+static int usbTestDeviceQueryBusAndDevId(uint16_t *pu16BusId, uint16_t *pu16DevId, USBTESTSPEED *penmSpeed)
+{
+ bool fFound = false;
+
+#define USBTEST_USB_DEV_SYSFS "/sys/bus/usb/devices/"
+
+ RTDIR hDirUsb = NULL;
+ int rc = RTDirOpen(&hDirUsb, USBTEST_USB_DEV_SYSFS);
+ if (RT_SUCCESS(rc))
+ {
+ do
+ {
+ RTDIRENTRY DirUsbBus;
+ rc = RTDirRead(hDirUsb, &DirUsbBus, NULL);
+ if ( RT_SUCCESS(rc)
+ && RTStrNCmp(DirUsbBus.szName, "usb", 3)
+ && RTLinuxSysFsExists(USBTEST_USB_DEV_SYSFS "%s/idVendor", DirUsbBus.szName))
+ {
+ int64_t idVendor = 0;
+ int64_t idProduct = 0;
+ int64_t iBusId = 0;
+ int64_t iDevId = 0;
+ char aszSpeed[20];
+
+ rc = RTLinuxSysFsReadIntFile(16, &idVendor, USBTEST_USB_DEV_SYSFS "%s/idVendor", DirUsbBus.szName);
+ if (RT_SUCCESS(rc))
+ rc = RTLinuxSysFsReadIntFile(16, &idProduct, USBTEST_USB_DEV_SYSFS "%s/idProduct", DirUsbBus.szName);
+ if (RT_SUCCESS(rc))
+ rc = RTLinuxSysFsReadIntFile(16, &iBusId, USBTEST_USB_DEV_SYSFS "%s/busnum", DirUsbBus.szName);
+ if (RT_SUCCESS(rc))
+ rc = RTLinuxSysFsReadIntFile(16, &iDevId, USBTEST_USB_DEV_SYSFS "%s/devnum", DirUsbBus.szName);
+ if (RT_SUCCESS(rc))
+ rc = RTLinuxSysFsReadStrFile(&aszSpeed[0], sizeof(aszSpeed), NULL, USBTEST_USB_DEV_SYSFS "%s/speed", DirUsbBus.szName);
+
+ if ( RT_SUCCESS(rc)
+ && idVendor == 0x0525
+ && idProduct == 0xa4a0)
+ {
+ if (penmSpeed)
+ {
+ /* Parse the speed. */
+ if (!RTStrCmp(&aszSpeed[0], "1.5"))
+ *penmSpeed = USBTESTSPEED_LOW;
+ else if (!RTStrCmp(&aszSpeed[0], "12"))
+ *penmSpeed = USBTESTSPEED_FULL;
+ else if (!RTStrCmp(&aszSpeed[0], "480"))
+ *penmSpeed = USBTESTSPEED_HIGH;
+ else if ( !RTStrCmp(&aszSpeed[0], "5000")
+ || !RTStrCmp(&aszSpeed[0], "10000"))
+ *penmSpeed = USBTESTSPEED_SUPER;
+ else
+ *penmSpeed = USBTESTSPEED_UNKNOWN;
+ }
+
+ if (pu16BusId)
+ *pu16BusId = (uint16_t)iBusId;
+ if (pu16DevId)
+ *pu16DevId = (uint16_t)iDevId;
+ fFound = true;
+ break;
+ }
+ }
+ else if (rc != VERR_NO_MORE_FILES)
+ rc = VINF_SUCCESS;
+
+ } while ( RT_SUCCESS(rc)
+ && !fFound);
+
+ if (rc == VERR_NO_MORE_FILES)
+ rc = VINF_SUCCESS;
+
+ RTDirClose(hDirUsb);
+ }
+
+ if (RT_SUCCESS(rc) && !fFound)
+ rc = VERR_NOT_FOUND;
+
+ return rc;
+}
+
+/**
+ * Search for a USB test device and return the device path.
+ *
+ * @returns Path to the USB test device or NULL if none was found.
+ */
+static char *usbTestFindDevice(void)
+{
+ /*
+ * Very crude and quick way to search for the correct test device.
+ * Assumption is that the path looks like /dev/bus/usb/%3d/%3d.
+ */
+ char *pszDevPath = NULL;
+
+ RTDIR hDirUsb = NULL;
+ int rc = RTDirOpen(&hDirUsb, "/dev/bus/usb");
+ if (RT_SUCCESS(rc))
+ {
+ do
+ {
+ RTDIRENTRY DirUsbBus;
+ rc = RTDirRead(hDirUsb, &DirUsbBus, NULL);
+ if (RT_SUCCESS(rc))
+ {
+ char aszPath[RTPATH_MAX + 1];
+ RTStrPrintf(&aszPath[0], RT_ELEMENTS(aszPath), "/dev/bus/usb/%s", DirUsbBus.szName);
+
+ RTDIR hDirUsbBus = NULL;
+ rc = RTDirOpen(&hDirUsbBus, &aszPath[0]);
+ if (RT_SUCCESS(rc))
+ {
+ do
+ {
+ RTDIRENTRY DirUsbDev;
+ rc = RTDirRead(hDirUsbBus, &DirUsbDev, NULL);
+ if (RT_SUCCESS(rc))
+ {
+ char aszPathDev[RTPATH_MAX + 1];
+ RTStrPrintf(&aszPathDev[0], RT_ELEMENTS(aszPathDev), "/dev/bus/usb/%s/%s",
+ DirUsbBus.szName, DirUsbDev.szName);
+
+ RTFILE hFileDev;
+ rc = RTFileOpen(&hFileDev, aszPathDev, RTFILE_O_OPEN | RTFILE_O_READ | RTFILE_O_DENY_NONE);
+ if (RT_SUCCESS(rc))
+ {
+ USBDEVDESC DevDesc;
+
+ rc = RTFileRead(hFileDev, &DevDesc, sizeof(DevDesc), NULL);
+ RTFileClose(hFileDev);
+
+ if ( RT_SUCCESS(rc)
+ && DevDesc.idVendor == 0x0525
+ && DevDesc.idProduct == 0xa4a0)
+ pszDevPath = RTStrDup(aszPathDev);
+ }
+
+ rc = VINF_SUCCESS;
+ }
+ else if (rc != VERR_NO_MORE_FILES)
+ rc = VINF_SUCCESS;
+
+ } while ( RT_SUCCESS(rc)
+ && !pszDevPath);
+
+ rc = VINF_SUCCESS;
+ RTDirClose(hDirUsbBus);
+ }
+ }
+ else if (rc != VERR_NO_MORE_FILES)
+ rc = VINF_SUCCESS;
+ } while ( RT_SUCCESS(rc)
+ && !pszDevPath);
+
+ RTDirClose(hDirUsb);
+ }
+
+ return pszDevPath;
+}
+
+static int usbTestIoctl(int iDevFd, int iInterface, PUSBTESTPARAMS pParams)
+{
+ struct usbdevfs_ioctl IoCtlData;
+
+ IoCtlData.ifno = iInterface;
+ IoCtlData.ioctl_code = (int)USBTEST_REQUEST;
+ IoCtlData.data = pParams;
+ return ioctl(iDevFd, USBDEVFS_IOCTL, &IoCtlData);
+}
+
+/**
+ * Test execution worker.
+ *
+ * @returns nothing.
+ * @param pszDevice The device to use for testing.
+ */
+static void usbTestExec(const char *pszDevice)
+{
+ int iDevFd;
+
+ RTTestSub(g_hTest, "Opening device");
+ iDevFd = open(pszDevice, O_RDWR);
+ if (iDevFd != -1)
+ {
+ USBTESTPARAMS Params;
+
+ RTTestPassed(g_hTest, "Opening device successful\n");
+
+ for (unsigned i = 0; i < RT_ELEMENTS(g_aTests); i++)
+ {
+ RTTestSub(g_hTest, g_aTests[i].pszName);
+
+ if (g_aTests[i].fExcluded)
+ {
+ RTTestSkipped(g_hTest, "Excluded from list");
+ continue;
+ }
+
+ int rc = g_aTests[i].pfnParamsSetup(i, g_aTests[i].pszName, &Params);
+ if (RT_SUCCESS(rc))
+ {
+ Params.idxTest = i;
+
+ /* Assume the test interface has the number 0 for now. */
+ int rcPosix = usbTestIoctl(iDevFd, 0, &Params);
+ if (rcPosix < 0 && errno == EOPNOTSUPP)
+ {
+ RTTestSkipped(g_hTest, "Not supported");
+ continue;
+ }
+
+ if (rcPosix < 0)
+ {
+ /*
+ * The error status code of the unlink testcase is
+ * offset by 2000 for the sync and 1000 for the sync code path
+ * (see drivers/usb/misc/usbtest.c in the Linux kernel sources).
+ *
+ * Adjust to the actual status code so converting doesn't assert.
+ */
+ int iTmpErrno = errno;
+ if (iTmpErrno >= 2000)
+ iTmpErrno -= 2000;
+ else if (iTmpErrno >= 1000)
+ iTmpErrno -= 1000;
+ RTTestFailed(g_hTest, "Test failed with %Rrc\n", RTErrConvertFromErrno(iTmpErrno));
+ }
+ else
+ {
+ uint64_t u64Ns = Params.TimeTest.tv_sec * RT_NS_1SEC + Params.TimeTest.tv_usec * RT_NS_1US;
+ RTTestValue(g_hTest, "Runtime", u64Ns, RTTESTUNIT_NS);
+ }
+ }
+ else
+ RTTestFailed(g_hTest, "Setting up test parameters failed with %Rrc\n", rc);
+ RTTestSubDone(g_hTest);
+ }
+
+ close(iDevFd);
+ }
+ else
+ RTTestFailed(g_hTest, "Opening device failed with %Rrc\n", RTErrConvertFromErrno(errno));
+
+}
+
+int main(int argc, char *argv[])
+{
+ /*
+ * Init IPRT and globals.
+ */
+ int rc = RTTestInitAndCreate("UsbTest", &g_hTest);
+ if (rc)
+ return rc;
+
+ /*
+ * Default values.
+ */
+ const char *pszDevice = NULL;
+
+ RTGETOPTUNION ValueUnion;
+ RTGETOPTSTATE GetState;
+ RTGetOptInit(&GetState, argc, argv, g_aCmdOptions, RT_ELEMENTS(g_aCmdOptions), 1, 0 /* fFlags */);
+ while ((rc = RTGetOpt(&GetState, &ValueUnion)))
+ {
+ switch (rc)
+ {
+ case 'h':
+ usbTestUsage(g_pStdOut);
+ return RTEXITCODE_SUCCESS;
+ case 'd':
+ pszDevice = ValueUnion.psz;
+ break;
+ case 's':
+ if (!RTStrICmp(ValueUnion.psz, "Low"))
+ g_enmSpeed = USBTESTSPEED_LOW;
+ else if (!RTStrICmp(ValueUnion.psz, "Full"))
+ g_enmSpeed = USBTESTSPEED_FULL;
+ else if (!RTStrICmp(ValueUnion.psz, "High"))
+ g_enmSpeed = USBTESTSPEED_HIGH;
+ else if (!RTStrICmp(ValueUnion.psz, "Super"))
+ g_enmSpeed = USBTESTSPEED_SUPER;
+ else
+ {
+ RTTestPrintf(g_hTest, RTTESTLVL_FAILURE, "Invalid speed passed to --expected-speed\n");
+ RTTestErrorInc(g_hTest);
+ return RTGetOptPrintError(VERR_INVALID_PARAMETER, &ValueUnion);
+ }
+ break;
+ case 'e':
+ if (ValueUnion.u32 < RT_ELEMENTS(g_aTests))
+ g_aTests[ValueUnion.u32].fExcluded = true;
+ else
+ {
+ RTTestPrintf(g_hTest, RTTESTLVL_FAILURE, "Invalid test number passed to --exclude\n");
+ RTTestErrorInc(g_hTest);
+ return RTGetOptPrintError(VERR_INVALID_PARAMETER, &ValueUnion);
+ }
+ break;
+ case 'a':
+ for (unsigned i = 0; i < RT_ELEMENTS(g_aTests); i++)
+ g_aTests[i].fExcluded = true;
+ break;
+ case 'i':
+ if (ValueUnion.u32 < RT_ELEMENTS(g_aTests))
+ g_aTests[ValueUnion.u32].fExcluded = false;
+ else
+ {
+ RTTestPrintf(g_hTest, RTTESTLVL_FAILURE, "Invalid test number passed to --include\n");
+ RTTestErrorInc(g_hTest);
+ return RTGetOptPrintError(VERR_INVALID_PARAMETER, &ValueUnion);
+ }
+ break;
+ default:
+ return RTGetOptPrintError(rc, &ValueUnion);
+ }
+ }
+
+ /*
+ * Start testing.
+ */
+ RTTestBanner(g_hTest);
+
+ /* Find the first test device if none was given. */
+ if (!pszDevice)
+ {
+ RTTestSub(g_hTest, "Detecting device");
+ pszDevice = usbTestFindDevice();
+ if (!pszDevice)
+ RTTestFailed(g_hTest, "Failed to find suitable device\n");
+
+ RTTestSubDone(g_hTest);
+ }
+
+ if (pszDevice)
+ {
+ /* First check that the requested speed matches. */
+ if (g_enmSpeed != USBTESTSPEED_ANY)
+ {
+ RTTestSub(g_hTest, "Checking correct device speed");
+
+ USBTESTSPEED enmSpeed = USBTESTSPEED_UNKNOWN;
+ rc = usbTestDeviceQueryBusAndDevId(NULL, NULL, &enmSpeed);
+ if (RT_SUCCESS(rc))
+ {
+ if (enmSpeed == g_enmSpeed)
+ RTTestPassed(g_hTest, "Reported device speed matches requested speed\n");
+ else
+ RTTestFailed(g_hTest, "Reported device speed doesn'match requested speed (%u vs %u)\n",
+ enmSpeed, g_enmSpeed);
+ }
+ else
+ RTTestFailed(g_hTest, "Failed to query device speed with rc=%Rrc\n", rc);
+
+ RTTestSubDone(g_hTest);
+ }
+ usbTestExec(pszDevice);
+ }
+
+ RTEXITCODE rcExit = RTTestSummaryAndDestroy(g_hTest);
+ return rcExit;
+}
+