// SPDX-License-Identifier: GPL-2.0 /* Copyright(c) 2013 - 2018 Intel Corporation. */ #include "i40e_diag.h" #include "i40e_prototype.h" /** * i40e_diag_reg_pattern_test * @hw: pointer to the hw struct * @reg: reg to be tested * @mask: bits to be touched **/ static i40e_status i40e_diag_reg_pattern_test(struct i40e_hw *hw, u32 reg, u32 mask) { static const u32 patterns[] = { 0x5A5A5A5A, 0xA5A5A5A5, 0x00000000, 0xFFFFFFFF }; u32 pat, val, orig_val; int i; orig_val = rd32(hw, reg); for (i = 0; i < ARRAY_SIZE(patterns); i++) { pat = patterns[i]; wr32(hw, reg, (pat & mask)); val = rd32(hw, reg); if ((val & mask) != (pat & mask)) { i40e_debug(hw, I40E_DEBUG_DIAG, "%s: reg pattern test failed - reg 0x%08x pat 0x%08x val 0x%08x\n", __func__, reg, pat, val); return I40E_ERR_DIAG_TEST_FAILED; } } wr32(hw, reg, orig_val); val = rd32(hw, reg); if (val != orig_val) { i40e_debug(hw, I40E_DEBUG_DIAG, "%s: reg restore test failed - reg 0x%08x orig_val 0x%08x val 0x%08x\n", __func__, reg, orig_val, val); return I40E_ERR_DIAG_TEST_FAILED; } return 0; } const struct i40e_diag_reg_test_info i40e_reg_list[] = { /* offset mask elements stride */ {I40E_QTX_CTL(0), 0x0000FFBF, 1, I40E_QTX_CTL(1) - I40E_QTX_CTL(0)}, {I40E_PFINT_ITR0(0), 0x00000FFF, 3, I40E_PFINT_ITR0(1) - I40E_PFINT_ITR0(0)}, {I40E_PFINT_ITRN(0, 0), 0x00000FFF, 1, I40E_PFINT_ITRN(0, 1) - I40E_PFINT_ITRN(0, 0)}, {I40E_PFINT_ITRN(1, 0), 0x00000FFF, 1, I40E_PFINT_ITRN(1, 1) - I40E_PFINT_ITRN(1, 0)}, {I40E_PFINT_ITRN(2, 0), 0x00000FFF, 1, I40E_PFINT_ITRN(2, 1) - I40E_PFINT_ITRN(2, 0)}, {I40E_PFINT_STAT_CTL0, 0x0000000C, 1, 0}, {I40E_PFINT_LNKLST0, 0x00001FFF, 1, 0}, {I40E_PFINT_LNKLSTN(0), 0x000007FF, 1, I40E_PFINT_LNKLSTN(1) - I40E_PFINT_LNKLSTN(0)}, {I40E_QINT_TQCTL(0), 0x000000FF, 1, I40E_QINT_TQCTL(1) - I40E_QINT_TQCTL(0)}, {I40E_QINT_RQCTL(0), 0x000000FF, 1, I40E_QINT_RQCTL(1) - I40E_QINT_RQCTL(0)}, {I40E_PFINT_ICR0_ENA, 0xF7F20000, 1, 0}, { 0 } }; /** * i40e_diag_reg_test * @hw: pointer to the hw struct * * Perform registers diagnostic test **/ i40e_status i40e_diag_reg_test(struct i40e_hw *hw) { i40e_status ret_code = 0; u32 reg, mask; u32 elements; u32 i, j; for (i = 0; i40e_reg_list[i].offset != 0 && !ret_code; i++) { elements = i40e_reg_list[i].elements; /* set actual reg range for dynamically allocated resources */ if (i40e_reg_list[i].offset == I40E_QTX_CTL(0) && hw->func_caps.num_tx_qp != 0) elements = hw->func_caps.num_tx_qp; if ((i40e_reg_list[i].offset == I40E_PFINT_ITRN(0, 0) || i40e_reg_list[i].offset == I40E_PFINT_ITRN(1, 0) || i40e_reg_list[i].offset == I40E_PFINT_ITRN(2, 0) || i40e_reg_list[i].offset == I40E_QINT_TQCTL(0) || i40e_reg_list[i].offset == I40E_QINT_RQCTL(0)) && hw->func_caps.num_msix_vectors != 0) elements = hw->func_caps.num_msix_vectors - 1; /* test register access */ mask = i40e_reg_list[i].mask; for (j = 0; j < elements && !ret_code; j++) { reg = i40e_reg_list[i].offset + (j * i40e_reg_list[i].stride); ret_code = i40e_diag_reg_pattern_test(hw, reg, mask); } } return ret_code; } /** * i40e_diag_eeprom_test * @hw: pointer to the hw struct * * Perform EEPROM diagnostic test **/ i40e_status i40e_diag_eeprom_test(struct i40e_hw *hw) { i40e_status ret_code; u16 reg_val; /* read NVM control word and if NVM valid, validate EEPROM checksum*/ ret_code = i40e_read_nvm_word(hw, I40E_SR_NVM_CONTROL_WORD, ®_val); if (!ret_code && ((reg_val & I40E_SR_CONTROL_WORD_1_MASK) == BIT(I40E_SR_CONTROL_WORD_1_SHIFT))) return i40e_validate_nvm_checksum(hw, NULL); else return I40E_ERR_DIAG_TEST_FAILED; }