Adding upstream version 5.10.209.upstream/5.10.209upstream

Signed-off-by: Daniel Baumann <daniel.baumann@progress-linux.org>

1 files changed, 419 insertions, 0 deletions

diff --git a/drivers/mtd/tests/nandbiterrs.c b/drivers/mtd/tests/nandbiterrs.c
new file mode 100644
index 000000000..08084c018
--- /dev/null
+++ b/drivers/mtd/tests/nandbiterrs.c
@@ -0,0 +1,419 @@
+// SPDX-License-Identifier: GPL-2.0-only
+/*
+ * Copyright © 2012 NetCommWireless
+ * Iwo Mergler <Iwo.Mergler@netcommwireless.com.au>
+ *
+ * Test for multi-bit error recovery on a NAND page This mostly tests the
+ * ECC controller / driver.
+ *
+ * There are two test modes:
+ *
+ *	0 - artificially inserting bit errors until the ECC fails
+ *	    This is the default method and fairly quick. It should
+ *	    be independent of the quality of the FLASH.
+ *
+ *	1 - re-writing the same pattern repeatedly until the ECC fails.
+ *	    This method relies on the physics of NAND FLASH to eventually
+ *	    generate '0' bits if '1' has been written sufficient times.
+ *	    Depending on the NAND, the first bit errors will appear after
+ *	    1000 or more writes and then will usually snowball, reaching the
+ *	    limits of the ECC quickly.
+ *
+ *	    The test stops after 10000 cycles, should your FLASH be
+ *	    exceptionally good and not generate bit errors before that. Try
+ *	    a different page in that case.
+ *
+ * Please note that neither of these tests will significantly 'use up' any
+ * FLASH endurance. Only a maximum of two erase operations will be performed.
+ */
+
+#define pr_fmt(fmt)	KBUILD_MODNAME ": " fmt
+
+#include <linux/init.h>
+#include <linux/module.h>
+#include <linux/moduleparam.h>
+#include <linux/mtd/mtd.h>
+#include <linux/err.h>
+#include <linux/mtd/rawnand.h>
+#include <linux/slab.h>
+#include "mtd_test.h"
+
+static int dev;
+module_param(dev, int, S_IRUGO);
+MODULE_PARM_DESC(dev, "MTD device number to use");
+
+static unsigned page_offset;
+module_param(page_offset, uint, S_IRUGO);
+MODULE_PARM_DESC(page_offset, "Page number relative to dev start");
+
+static unsigned seed;
+module_param(seed, uint, S_IRUGO);
+MODULE_PARM_DESC(seed, "Random seed");
+
+static int mode;
+module_param(mode, int, S_IRUGO);
+MODULE_PARM_DESC(mode, "0=incremental errors, 1=overwrite test");
+
+static unsigned max_overwrite = 10000;
+
+static loff_t   offset;     /* Offset of the page we're using. */
+static unsigned eraseblock; /* Eraseblock number for our page. */
+
+/* We assume that the ECC can correct up to a certain number
+ * of biterrors per subpage. */
+static unsigned subsize;  /* Size of subpages */
+static unsigned subcount; /* Number of subpages per page */
+
+static struct mtd_info *mtd;   /* MTD device */
+
+static uint8_t *wbuffer; /* One page write / compare buffer */
+static uint8_t *rbuffer; /* One page read buffer */
+
+/* 'random' bytes from known offsets */
+static uint8_t hash(unsigned offset)
+{
+	unsigned v = offset;
+	unsigned char c;
+	v ^= 0x7f7edfd3;
+	v = v ^ (v >> 3);
+	v = v ^ (v >> 5);
+	v = v ^ (v >> 13);
+	c = v & 0xFF;
+	/* Reverse bits of result. */
+	c = (c & 0x0F) << 4 | (c & 0xF0) >> 4;
+	c = (c & 0x33) << 2 | (c & 0xCC) >> 2;
+	c = (c & 0x55) << 1 | (c & 0xAA) >> 1;
+	return c;
+}
+
+/* Writes wbuffer to page */
+static int write_page(int log)
+{
+	if (log)
+		pr_info("write_page\n");
+
+	return mtdtest_write(mtd, offset, mtd->writesize, wbuffer);
+}
+
+/* Re-writes the data area while leaving the OOB alone. */
+static int rewrite_page(int log)
+{
+	int err = 0;
+	struct mtd_oob_ops ops;
+
+	if (log)
+		pr_info("rewrite page\n");
+
+	ops.mode      = MTD_OPS_RAW; /* No ECC */
+	ops.len       = mtd->writesize;
+	ops.retlen    = 0;
+	ops.ooblen    = 0;
+	ops.oobretlen = 0;
+	ops.ooboffs   = 0;
+	ops.datbuf    = wbuffer;
+	ops.oobbuf    = NULL;
+
+	err = mtd_write_oob(mtd, offset, &ops);
+	if (err || ops.retlen != mtd->writesize) {
+		pr_err("error: write_oob failed (%d)\n", err);
+		if (!err)
+			err = -EIO;
+	}
+
+	return err;
+}
+
+/* Reads page into rbuffer. Returns number of corrected bit errors (>=0)
+ * or error (<0) */
+static int read_page(int log)
+{
+	int err = 0;
+	size_t read;
+	struct mtd_ecc_stats oldstats;
+
+	if (log)
+		pr_info("read_page\n");
+
+	/* Saving last mtd stats */
+	memcpy(&oldstats, &mtd->ecc_stats, sizeof(oldstats));
+
+	err = mtd_read(mtd, offset, mtd->writesize, &read, rbuffer);
+	if (!err || err == -EUCLEAN)
+		err = mtd->ecc_stats.corrected - oldstats.corrected;
+
+	if (err < 0 || read != mtd->writesize) {
+		pr_err("error: read failed at %#llx\n", (long long)offset);
+		if (err >= 0)
+			err = -EIO;
+	}
+
+	return err;
+}
+
+/* Verifies rbuffer against random sequence */
+static int verify_page(int log)
+{
+	unsigned i, errs = 0;
+
+	if (log)
+		pr_info("verify_page\n");
+
+	for (i = 0; i < mtd->writesize; i++) {
+		if (rbuffer[i] != hash(i+seed)) {
+			pr_err("Error: page offset %u, expected %02x, got %02x\n",
+				i, hash(i+seed), rbuffer[i]);
+			errs++;
+		}
+	}
+
+	if (errs)
+		return -EIO;
+	else
+		return 0;
+}
+
+#define CBIT(v, n) ((v) & (1 << (n)))
+#define BCLR(v, n) ((v) = (v) & ~(1 << (n)))
+
+/* Finds the first '1' bit in wbuffer starting at offset 'byte'
+ * and sets it to '0'. */
+static int insert_biterror(unsigned byte)
+{
+	int bit;
+
+	while (byte < mtd->writesize) {
+		for (bit = 7; bit >= 0; bit--) {
+			if (CBIT(wbuffer[byte], bit)) {
+				BCLR(wbuffer[byte], bit);
+				pr_info("Inserted biterror @ %u/%u\n", byte, bit);
+				return 0;
+			}
+		}
+		byte++;
+	}
+	pr_err("biterror: Failed to find a '1' bit\n");
+	return -EIO;
+}
+
+/* Writes 'random' data to page and then introduces deliberate bit
+ * errors into the page, while verifying each step. */
+static int incremental_errors_test(void)
+{
+	int err = 0;
+	unsigned i;
+	unsigned errs_per_subpage = 0;
+
+	pr_info("incremental biterrors test\n");
+
+	for (i = 0; i < mtd->writesize; i++)
+		wbuffer[i] = hash(i+seed);
+
+	err = write_page(1);
+	if (err)
+		goto exit;
+
+	while (1) {
+
+		err = rewrite_page(1);
+		if (err)
+			goto exit;
+
+		err = read_page(1);
+		if (err > 0)
+			pr_info("Read reported %d corrected bit errors\n", err);
+		if (err < 0) {
+			pr_err("After %d biterrors per subpage, read reported error %d\n",
+				errs_per_subpage, err);
+			err = 0;
+			goto exit;
+		}
+
+		err = verify_page(1);
+		if (err) {
+			pr_err("ECC failure, read data is incorrect despite read success\n");
+			goto exit;
+		}
+
+		pr_info("Successfully corrected %d bit errors per subpage\n",
+			errs_per_subpage);
+
+		for (i = 0; i < subcount; i++) {
+			err = insert_biterror(i * subsize);
+			if (err < 0)
+				goto exit;
+		}
+		errs_per_subpage++;
+	}
+
+exit:
+	return err;
+}
+
+
+/* Writes 'random' data to page and then re-writes that same data repeatedly.
+   This eventually develops bit errors (bits written as '1' will slowly become
+   '0'), which are corrected as far as the ECC is capable of. */
+static int overwrite_test(void)
+{
+	int err = 0;
+	unsigned i;
+	unsigned max_corrected = 0;
+	unsigned opno = 0;
+	/* We don't expect more than this many correctable bit errors per
+	 * page. */
+	#define MAXBITS 512
+	static unsigned bitstats[MAXBITS]; /* bit error histogram. */
+
+	memset(bitstats, 0, sizeof(bitstats));
+
+	pr_info("overwrite biterrors test\n");
+
+	for (i = 0; i < mtd->writesize; i++)
+		wbuffer[i] = hash(i+seed);
+
+	err = write_page(1);
+	if (err)
+		goto exit;
+
+	while (opno < max_overwrite) {
+
+		err = write_page(0);
+		if (err)
+			break;
+
+		err = read_page(0);
+		if (err >= 0) {
+			if (err >= MAXBITS) {
+				pr_info("Implausible number of bit errors corrected\n");
+				err = -EIO;
+				break;
+			}
+			bitstats[err]++;
+			if (err > max_corrected) {
+				max_corrected = err;
+				pr_info("Read reported %d corrected bit errors\n",
+					err);
+			}
+		} else { /* err < 0 */
+			pr_info("Read reported error %d\n", err);
+			err = 0;
+			break;
+		}
+
+		err = verify_page(0);
+		if (err) {
+			bitstats[max_corrected] = opno;
+			pr_info("ECC failure, read data is incorrect despite read success\n");
+			break;
+		}
+
+		err = mtdtest_relax();
+		if (err)
+			break;
+
+		opno++;
+	}
+
+	/* At this point bitstats[0] contains the number of ops with no bit
+	 * errors, bitstats[1] the number of ops with 1 bit error, etc. */
+	pr_info("Bit error histogram (%d operations total):\n", opno);
+	for (i = 0; i < max_corrected; i++)
+		pr_info("Page reads with %3d corrected bit errors: %d\n",
+			i, bitstats[i]);
+
+exit:
+	return err;
+}
+
+static int __init mtd_nandbiterrs_init(void)
+{
+	int err = 0;
+
+	printk("\n");
+	printk(KERN_INFO "==================================================\n");
+	pr_info("MTD device: %d\n", dev);
+
+	mtd = get_mtd_device(NULL, dev);
+	if (IS_ERR(mtd)) {
+		err = PTR_ERR(mtd);
+		pr_err("error: cannot get MTD device\n");
+		goto exit_mtddev;
+	}
+
+	if (!mtd_type_is_nand(mtd)) {
+		pr_info("this test requires NAND flash\n");
+		err = -ENODEV;
+		goto exit_nand;
+	}
+
+	pr_info("MTD device size %llu, eraseblock=%u, page=%u, oob=%u\n",
+		(unsigned long long)mtd->size, mtd->erasesize,
+		mtd->writesize, mtd->oobsize);
+
+	subsize  = mtd->writesize >> mtd->subpage_sft;
+	subcount = mtd->writesize / subsize;
+
+	pr_info("Device uses %d subpages of %d bytes\n", subcount, subsize);
+
+	offset     = (loff_t)page_offset * mtd->writesize;
+	eraseblock = mtd_div_by_eb(offset, mtd);
+
+	pr_info("Using page=%u, offset=%llu, eraseblock=%u\n",
+		page_offset, offset, eraseblock);
+
+	wbuffer = kmalloc(mtd->writesize, GFP_KERNEL);
+	if (!wbuffer) {
+		err = -ENOMEM;
+		goto exit_wbuffer;
+	}
+
+	rbuffer = kmalloc(mtd->writesize, GFP_KERNEL);
+	if (!rbuffer) {
+		err = -ENOMEM;
+		goto exit_rbuffer;
+	}
+
+	err = mtdtest_erase_eraseblock(mtd, eraseblock);
+	if (err)
+		goto exit_error;
+
+	if (mode == 0)
+		err = incremental_errors_test();
+	else
+		err = overwrite_test();
+
+	if (err)
+		goto exit_error;
+
+	/* We leave the block un-erased in case of test failure. */
+	err = mtdtest_erase_eraseblock(mtd, eraseblock);
+	if (err)
+		goto exit_error;
+
+	err = -EIO;
+	pr_info("finished successfully.\n");
+	printk(KERN_INFO "==================================================\n");
+
+exit_error:
+	kfree(rbuffer);
+exit_rbuffer:
+	kfree(wbuffer);
+exit_wbuffer:
+	/* Nothing */
+exit_nand:
+	put_mtd_device(mtd);
+exit_mtddev:
+	return err;
+}
+
+static void __exit mtd_nandbiterrs_exit(void)
+{
+	return;
+}
+
+module_init(mtd_nandbiterrs_init);
+module_exit(mtd_nandbiterrs_exit);
+
+MODULE_DESCRIPTION("NAND bit error recovery test");
+MODULE_AUTHOR("Iwo Mergler");
+MODULE_LICENSE("GPL");