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| -rw-r--r-- | Documentation/ABI/testing/sysfs-bus-iio-temperature-max31856 | 31 |
1 files changed, 31 insertions, 0 deletions
diff --git a/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31856 b/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31856 new file mode 100644 index 000000000..e5ef6d8e5 --- /dev/null +++ b/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31856 @@ -0,0 +1,31 @@ +What: /sys/bus/iio/devices/iio:deviceX/fault_oc +KernelVersion: 5.1 +Contact: linux-iio@vger.kernel.org +Description: + Open-circuit fault. The detection of open-circuit faults, + such as those caused by broken thermocouple wires. + Reading returns either '1' or '0'. + + === ======================================================= + '1' An open circuit such as broken thermocouple wires + has been detected. + '0' No open circuit or broken thermocouple wires are detected + === ======================================================= + +What: /sys/bus/iio/devices/iio:deviceX/fault_ovuv +KernelVersion: 5.1 +Contact: linux-iio@vger.kernel.org +Description: + Overvoltage or Undervoltage Input Fault. The internal circuitry + is protected from excessive voltages applied to the thermocouple + cables by integrated MOSFETs at the T+ and T- inputs, and the + BIAS output. These MOSFETs turn off when the input voltage is + negative or greater than VDD. + + Reading returns either '1' or '0'. + + === ======================================================= + '1' The input voltage is negative or greater than VDD. + '0' The input voltage is positive and less than VDD (normal + state). + === ======================================================= |