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Diffstat (limited to 'Documentation/ABI/testing/sysfs-devices-xenbus')
| -rw-r--r-- | Documentation/ABI/testing/sysfs-devices-xenbus | 41 |
1 files changed, 41 insertions, 0 deletions
diff --git a/Documentation/ABI/testing/sysfs-devices-xenbus b/Documentation/ABI/testing/sysfs-devices-xenbus new file mode 100644 index 0000000000..fd796cb4f3 --- /dev/null +++ b/Documentation/ABI/testing/sysfs-devices-xenbus @@ -0,0 +1,41 @@ +What: /sys/devices/*/xenbus/event_channels +Date: February 2021 +Contact: Xen Developers mailing list <xen-devel@lists.xenproject.org> +Description: + Number of Xen event channels associated with a kernel based + paravirtualized device frontend or backend. + +What: /sys/devices/*/xenbus/events +Date: February 2021 +Contact: Xen Developers mailing list <xen-devel@lists.xenproject.org> +Description: + Total number of Xen events received for a Xen pv device + frontend or backend. + +What: /sys/devices/*/xenbus/jiffies_eoi_delayed +Date: February 2021 +Contact: Xen Developers mailing list <xen-devel@lists.xenproject.org> +Description: + Summed up time in jiffies the EOI of an interrupt for a Xen + pv device has been delayed in order to avoid stalls due to + event storms. This value rising is a first sign for a rogue + other end of the pv device. + +What: /sys/devices/*/xenbus/spurious_events +Date: February 2021 +Contact: Xen Developers mailing list <xen-devel@lists.xenproject.org> +Description: + Number of events received for a Xen pv device which did not + require any action. Too many spurious events in a row will + trigger delayed EOI processing. + +What: /sys/devices/*/xenbus/spurious_threshold +Date: February 2021 +Contact: Xen Developers mailing list <xen-devel@lists.xenproject.org> +Description: + Controls the tolerated number of subsequent spurious events + before delayed EOI processing is triggered for a Xen pv + device. Default is 1. This can be modified in case the other + end of the pv device is issuing spurious events on a regular + basis and is known not to be malicious on purpose. Raising + the value for such cases can improve pv device performance. |