Adding upstream version 2.8.upstream/2.8

Signed-off-by: Daniel Baumann <daniel.baumann@progress-linux.org>

1 files changed, 90 insertions, 0 deletions

diff --git a/Documentation/nvme-micron-smart-add-log.1 b/Documentation/nvme-micron-smart-add-log.1
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+'\" t
+.\"     Title: nvme-micron-smart-add-log
+.\"    Author: [FIXME: author] [see http://www.docbook.org/tdg5/en/html/author]
+.\" Generator: DocBook XSL Stylesheets vsnapshot <http://docbook.sf.net/>
+.\"      Date: 02/14/2024
+.\"    Manual: NVMe Manual
+.\"    Source: NVMe
+.\"  Language: English
+.\"
+.TH "NVME\-MICRON\-SMART\" "1" "02/14/2024" "NVMe" "NVMe Manual"
+.\" -----------------------------------------------------------------
+.\" * Define some portability stuff
+.\" -----------------------------------------------------------------
+.\" ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
+.\" http://bugs.debian.org/507673
+.\" http://lists.gnu.org/archive/html/groff/2009-02/msg00013.html
+.\" ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
+.ie \n(.g .ds Aq \(aq
+.el       .ds Aq '
+.\" -----------------------------------------------------------------
+.\" * set default formatting
+.\" -----------------------------------------------------------------
+.\" disable hyphenation
+.nh
+.\" disable justification (adjust text to left margin only)
+.ad l
+.\" -----------------------------------------------------------------
+.\" * MAIN CONTENT STARTS HERE *
+.\" -----------------------------------------------------------------
+.SH "NAME"
+nvme-micron-smart-add-log \- Retrieves NAND statistics (2200 model drives) or Extended SMART information (OCP complaint models) of given micron device
+.SH "SYNOPSIS"
+.sp
+.nf
+\fInvme micron vs\-smart\-add\-log\fR <device> \-f <json|normal>
+.fi
+.SH "DESCRIPTION"
+.sp
+This command prints NAND information (Total bytes written, Bad block count and Erase failures etc) for the given micron device if its of 2200 model controller\&. For OCP complaint controllers this command print extended SMART health data along with NAND information (if available)
+.sp
+The <device> parameter is mandatory and may be either the NVMe character device (ex: /dev/nvme0), or a namespace block device (ex: /dev/nvme0n1)\&.
+.sp
+The \fI\-f\fR option controls the displayed output data format based on the option value\&. If the option value is \fIjson\fR (which is enabled by default), output data is printed in JSON format\&. If option value is \fInormal\fR the output is displayed in non\-JSON format\&.
+.sp
+This will only work on Micron devices devices of model numbers 54XX and OCP complaint controllers\&. Support for new devices may be added subsequently\&.
+.SH "OPTIONS"
+.PP
+\-f <json|normal>
+.RS 4
+Controls the format of displayed output\&.
+.RE
+.SH "EXAMPLES"
+.sp
+.RS 4
+.ie n \{\
+\h'-04'\(bu\h'+03'\c
+.\}
+.el \{\
+.sp -1
+.IP \(bu 2.3
+.\}
+Retrieve NAND/extended SMART data and display in json format
+.sp
+.if n \{\
+.RS 4
+.\}
+.nf
+# nvme micron vs\-nand\-stats /dev/nvme0
+
+* Retrieve NAND/extended SMART data and display in non\-json format
++
+.fi
+.if n \{\
+.RE
+.\}
+.RE
+.sp
+# nvme micron vs\-nand\-stats /dev/nvme0 \-f normal
+.sp
+.if n \{\
+.RS 4
+.\}
+.nf
+NVME
+.fi
+.if n \{\
+.RE
+.\}
+.sp
+Part of the nvme\-user suite