From f26f66d866ba1a9f3204e6fdfe2b07e67b5492ad Mon Sep 17 00:00:00 2001 From: Daniel Baumann Date: Wed, 10 Apr 2024 21:41:32 +0200 Subject: Adding upstream version 2.8. Signed-off-by: Daniel Baumann --- .../nvme-virtium-save-smart-to-vtview-log.html | 885 +++++++++++++++++++++ 1 file changed, 885 insertions(+) create mode 100644 Documentation/nvme-virtium-save-smart-to-vtview-log.html (limited to 'Documentation/nvme-virtium-save-smart-to-vtview-log.html') diff --git a/Documentation/nvme-virtium-save-smart-to-vtview-log.html b/Documentation/nvme-virtium-save-smart-to-vtview-log.html new file mode 100644 index 0000000..5edfd37 --- /dev/null +++ b/Documentation/nvme-virtium-save-smart-to-vtview-log.html @@ -0,0 +1,885 @@ + + + + + + +nvme-virtium-save-smart-to-vtview-log(1) + + + + + +
+
+

SYNOPSIS

+
+
+
nvme virtium save-smart-to-vtview-log <device> [--run-time=<NUM> | -r <NUM>]
+                        [--freq=<NUM> | -f <NUM>]
+                        [--output-file=<FILE> | -o <FILE>]
+                        [--test-name=<NAME> | -n <NAME>]
+
+
+
+
+
+

DESCRIPTION

+
+

This command automates the process of collecting SMART data periodically and +saving the data in a ready-to-analyze format. Each entry is saved +with timestamp and in csv format. Users can use excel to analyze the data. +Some examples of use cases are collecting SMART data for temperature +characterization, data to calculate endurance, or collecting SMART data during a +test or during normal operation.

+

The <device> parameter is mandatory and may be either the NVMe character +device (ex: /dev/nvme0), or a namespace block device (ex: /dev/nvme0n1).

+

On success, the command generates a log file, which contains an entry for +identify device (current features & settings) and periodic entries of SMART data.

+

This command runs for the time specified by the option <run-time>, and collects +SMART data at the frequency specified by the option <freq>. If the output file +name is not specified, this command will generate a file name that include model +string and serial number of the device.

+

If the test-name option is specified, it will be recorded in the log file and be +used as part of the log file name.

+
+
+
+

OPTIONS

+
+
+
+-r <NUM> +
+
+--run-time=<NUM> +
+
+

+ (optional) Number of hours to log data (default = 20 hours) +

+
+
+-f <NUM> +
+
+--freq=<NUM> +
+
+

+ (optional) How often you want to log SMART data (0.25 = 15', 0.5 = 30', + 1 = 1 hour, 2 = 2 hours, etc.). Default = 10 hours. +

+
+
+-o <FILE> +
+
+--output-file=<FILE> +
+
+

+ (optional) Name of the log file (give it a name that easy for you to + remember what the test is). You can leave it blank too, the file name + will be generated as <model string>-<serial number>-<test name>.txt. +

+
+
+-n <NAME> +
+
+--test-name=<NAME> +
+
+

+ (optional) Name of the test you are doing. We use this string as part of + the name of the log file. +

+
+
+
+
+
+

EXAMPLES

+
+
    +
  • +

    +Temperature characterization: +

    +
    +
    +
    # nvme virtium save-smart-to-vtview-log /dev/yourDevice --run-time=100 --record-frequency=0.25 --test-name=burn-in-at-(-40)
    +
    +
    • +
  • +

    +Endurance testing: +

    +
    +
    +
    # nvme virtium save-smart-to-vtview-log /dev/yourDevice --run-time=100 --record-frequency=1 --test-name=Endurance-test-JEDEG-219-workload
    +
    +
    • +
  • +

    +Just logging: Default logging is run for 20 hours and log every 10 hours. +

    +
    +
    +
    # nvme virtium save-smart-to-vtview-log /dev/yourDevice
    +
    +
    • +
+
+
+
+

NVME

+
+

Part of the nvme-user suite

+
+
+
+
+ + + -- cgit v1.2.3