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author | Daniel Baumann <daniel.baumann@progress-linux.org> | 2023-12-24 07:57:49 +0000 |
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committer | Daniel Baumann <daniel.baumann@progress-linux.org> | 2023-12-24 07:57:49 +0000 |
commit | fc67d3ad9a2903cc33e5cdaedaad51dd86a42236 (patch) | |
tree | 4ef72536a965fe220e71aea78b76b6bbbac2ed59 /Documentation/nvme-virtium-save-smart-to-vtview-log.1 | |
parent | Adding upstream version 2.5. (diff) | |
download | nvme-cli-fc67d3ad9a2903cc33e5cdaedaad51dd86a42236.tar.xz nvme-cli-fc67d3ad9a2903cc33e5cdaedaad51dd86a42236.zip |
Adding upstream version 2.7.1.upstream/2.7.1
Signed-off-by: Daniel Baumann <daniel.baumann@progress-linux.org>
Diffstat (limited to '')
-rw-r--r-- | Documentation/nvme-virtium-save-smart-to-vtview-log.1 | 8 |
1 files changed, 4 insertions, 4 deletions
diff --git a/Documentation/nvme-virtium-save-smart-to-vtview-log.1 b/Documentation/nvme-virtium-save-smart-to-vtview-log.1 index 292c91b..b21beba 100644 --- a/Documentation/nvme-virtium-save-smart-to-vtview-log.1 +++ b/Documentation/nvme-virtium-save-smart-to-vtview-log.1 @@ -2,12 +2,12 @@ .\" Title: nvme-virtium-save-smart-to-vtview-log .\" Author: [FIXME: author] [see http://www.docbook.org/tdg5/en/html/author] .\" Generator: DocBook XSL Stylesheets vsnapshot <http://docbook.sf.net/> -.\" Date: 06/30/2023 +.\" Date: 12/21/2023 .\" Manual: NVMe Manual .\" Source: NVMe .\" Language: English .\" -.TH "NVME\-VIRTIUM\-SAVE\" "1" "06/30/2023" "NVMe" "NVMe Manual" +.TH "NVME\-VIRTIUM\-SAVE\" "1" "12/21/2023" "NVMe" "NVMe Manual" .\" ----------------------------------------------------------------- .\" * Define some portability stuff .\" ----------------------------------------------------------------- @@ -39,7 +39,7 @@ nvme-virtium-save-smart-to-vtview-log \- Periodically save smart attributes into .fi .SH "DESCRIPTION" .sp -This command automates the process of collecting SMART data periodically and saving the data in a ready\-to\-analyze format\&. Each entry is saved with timestamp and in csv format\&. Users can use excel to analyze the data\&. Some examples of use cases are collecting SMART data for temperature characterization, collecting data to calculate endurance, or collecting SMART data during a test or during normal operation\&. +This command automates the process of collecting SMART data periodically and saving the data in a ready\-to\-analyze format\&. Each entry is saved with timestamp and in csv format\&. Users can use excel to analyze the data\&. Some examples of use cases are collecting SMART data for temperature characterization, data to calculate endurance, or collecting SMART data during a test or during normal operation\&. .sp The <device> parameter is mandatory and may be either the NVMe character device (ex: /dev/nvme0), or a namespace block device (ex: /dev/nvme0n1)\&. .sp @@ -57,7 +57,7 @@ If the test\-name option is specified, it will be recorded in the log file and b .PP \-f <NUM>, \-\-freq=<NUM> .RS 4 -(optional) How often you want to log SMART data (0\&.25 = 15\*(Aq , 0\&.5 = 30\*(Aq , 1 = 1 hour, 2 = 2 hours, etc\&.)\&. Default = 10 hours\&. +(optional) How often you want to log SMART data (0\&.25 = 15\*(Aq, 0\&.5 = 30\*(Aq, 1 = 1 hour, 2 = 2 hours, etc\&.)\&. Default = 10 hours\&. .RE .PP \-o <FILE>, \-\-output\-file=<FILE> |