From dc597ce8df5ae6efd2728a2d7ba7d92486028f79 Mon Sep 17 00:00:00 2001
From: Daniel Baumann <daniel.baumann@progress-linux.org>
Date: Fri, 2 Jul 2021 22:40:30 +0200
Subject: Adding upstream version 1.12.

Signed-off-by: Daniel Baumann <daniel.baumann@progress-linux.org>
---
 .../nvme-virtium-save-smart-to-vtview-log.txt      | 84 ++++++++++++++++++++++
 1 file changed, 84 insertions(+)
 create mode 100755 Documentation/nvme-virtium-save-smart-to-vtview-log.txt

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+nvme-virtium-save-smart-to-vtview-log(1)
+========================================
+
+NAME
+----
+nvme-virtium-save-smart-to-vtview-log - Periodically save smart attributes into a log file (csv format).
+
+SYNOPSIS
+--------
+[verse]
+'nvme virtium save-smart-to-vtview-log' <device> [--run-time=<NUM> | -r <NUM>]
+			[--freq=<NUM> | -f <NUM>]
+			[--output-file=<FILE> | -o <FILE>]
+			[--test-name=<NAME> | -n <NAME>]
+			
+DESCRIPTION
+-----------
+This command automates the process of collecting SMART data periodically and
+saving the data in a ready-to-analyze format. Each entry is saved 
+with timestamp and in csv format. Users can use excel to analyze the data.
+Some examples of use cases are collecting SMART data for temperature characterization,
+collecting data to calculate endurance, or collecting SMART data during a test
+or during normal operation.
+
+The <device> parameter is mandatory and may be either the NVMe character
+device (ex: /dev/nvme0), or a namespace block device (ex: /dev/nvme0n1).
+
+On success, the command generates a log file, which contains an entry for identify device
+(current features & settings) and periodic entries of SMART data. 
+
+This command runs for the time specified by the option <run-time>, and collects SMART data
+at the frequency specified by the option <freq>. If the output file name is not specified,
+this command will generate a file name that include model string and serial number of the device.
+
+If the test-name option is specified, it will be recorded in the log file and be used as part
+of the log file name.
+
+OPTIONS
+-------
+-r <NUM>::
+--run-tim=<NUM>::
+	(optional) Number of hours to log data (default = 20 hours)
+
+-f <NUM>::
+--freq=<NUM>::
+	(optional) How often you want to log SMART data
+	(0.25 = 15' , 0.5 = 30' , 1 = 1 hour, 2 = 2 hours, etc.). Default = 10 hours.
+
+-o <FILE>::
+--output-file=<FILE>::
+    (optional) Name of the log file (give it a name that easy for you to remember 
+	what the test is). You can leave it blank too, the file name will be generated
+	as <model string>-<serial number>-<test name>.txt.
+
+-n <NAME>::
+--test-name=<NAME>::
+    (optional) Name of the test you are doing. We use this string as part of the name of the log file.
+	
+	
+EXAMPLES
+--------
+* Temperature characterization:
++
+------------
+# nvme virtium save-smart-to-vtview-log /dev/yourDevice --run-time=100 --record-frequency=0.25 --test-name=burn-in-at-(-40)
+------------
++
+
+* Endurance testing:
++
+------------
+# nvme virtium save-smart-to-vtview-log /dev/yourDevice --run-time=100 --record-frequency=1 --test-name=Endurance-test-JEDEG-219-workload
+------------
++
+
+* Just logging: Default logging is run for 20 hours and log every 10 hours.
++
+------------
+# nvme virtium save-smart-to-vtview-log /dev/yourDevice
+------------
+
+NVME
+----
+Part of the nvme-user suite
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