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.\"     Title: nvme-virtium-save-smart-to-vtview-log
.\"    Author: [FIXME: author] [see http://www.docbook.org/tdg5/en/html/author]
.\" Generator: DocBook XSL Stylesheets vsnapshot <http://docbook.sf.net/>
.\"      Date: 05/03/2024
.\"    Manual: NVMe Manual
.\"    Source: NVMe
.\"  Language: English
.\"
.TH "NVME\-VIRTIUM\-SAVE\" "1" "05/03/2024" "NVMe" "NVMe Manual"
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.SH "NAME"
nvme-virtium-save-smart-to-vtview-log \- Periodically save smart attributes into a log file (csv format)\&.
.SH "SYNOPSIS"
.sp
.nf
\fInvme virtium save\-smart\-to\-vtview\-log\fR <device> [\-\-run\-time=<NUM> | \-r <NUM>]
                        [\-\-freq=<NUM> | \-f <NUM>]
                        [\-\-output\-file=<FILE> | \-o <FILE>]
                        [\-\-test\-name=<NAME> | \-n <NAME>]
.fi
.SH "DESCRIPTION"
.sp
This command automates the process of collecting SMART data periodically and saving the data in a ready\-to\-analyze format\&. Each entry is saved with timestamp and in csv format\&. Users can use excel to analyze the data\&. Some examples of use cases are collecting SMART data for temperature characterization, data to calculate endurance, or collecting SMART data during a test or during normal operation\&.
.sp
The <device> parameter is mandatory and may be either the NVMe character device (ex: /dev/nvme0), or a namespace block device (ex: /dev/nvme0n1)\&.
.sp
On success, the command generates a log file, which contains an entry for identify device (current features & settings) and periodic entries of SMART data\&.
.sp
This command runs for the time specified by the option <run\-time>, and collects SMART data at the frequency specified by the option <freq>\&. If the output file name is not specified, this command will generate a file name that include model string and serial number of the device\&.
.sp
If the test\-name option is specified, it will be recorded in the log file and be used as part of the log file name\&.
.SH "OPTIONS"
.PP
\-r <NUM>, \-\-run\-time=<NUM>
.RS 4
(optional) Number of hours to log data (default = 20 hours)
.RE
.PP
\-f <NUM>, \-\-freq=<NUM>
.RS 4
(optional) How often you want to log SMART data (0\&.25 = 15\*(Aq, 0\&.5 = 30\*(Aq, 1 = 1 hour, 2 = 2 hours, etc\&.)\&. Default = 10 hours\&.
.RE
.PP
\-o <FILE>, \-\-output\-file=<FILE>
.RS 4
(optional) Name of the log file (give it a name that easy for you to remember what the test is)\&. You can leave it blank too, the file name will be generated as <model string>\-<serial number>\-<test name>\&.txt\&.
.RE
.PP
\-n <NAME>, \-\-test\-name=<NAME>
.RS 4
(optional) Name of the test you are doing\&. We use this string as part of the name of the log file\&.
.RE
.SH "EXAMPLES"
.sp
.RS 4
.ie n \{\
\h'-04'\(bu\h'+03'\c
.\}
.el \{\
.sp -1
.IP \(bu 2.3
.\}
Temperature characterization:
.sp
.if n \{\
.RS 4
.\}
.nf
# nvme virtium save\-smart\-to\-vtview\-log /dev/yourDevice \-\-run\-time=100 \-\-record\-frequency=0\&.25 \-\-test\-name=burn\-in\-at\-(\-40)
.fi
.if n \{\
.RE
.\}
.RE
.sp
.RS 4
.ie n \{\
\h'-04'\(bu\h'+03'\c
.\}
.el \{\
.sp -1
.IP \(bu 2.3
.\}
Endurance testing:
.sp
.if n \{\
.RS 4
.\}
.nf
# nvme virtium save\-smart\-to\-vtview\-log /dev/yourDevice \-\-run\-time=100 \-\-record\-frequency=1 \-\-test\-name=Endurance\-test\-JEDEG\-219\-workload
.fi
.if n \{\
.RE
.\}
.RE
.sp
.RS 4
.ie n \{\
\h'-04'\(bu\h'+03'\c
.\}
.el \{\
.sp -1
.IP \(bu 2.3
.\}
Just logging: Default logging is run for 20 hours and log every 10 hours\&.
.sp
.if n \{\
.RS 4
.\}
.nf
# nvme virtium save\-smart\-to\-vtview\-log /dev/yourDevice
.fi
.if n \{\
.RE
.\}
.RE
.SH "NVME"
.sp
Part of the nvme\-user suite