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Diffstat (limited to 'tools/testing/nvdimm/test/ndtest.h')
-rw-r--r-- | tools/testing/nvdimm/test/ndtest.h | 109 |
1 files changed, 109 insertions, 0 deletions
diff --git a/tools/testing/nvdimm/test/ndtest.h b/tools/testing/nvdimm/test/ndtest.h new file mode 100644 index 000000000..2c54c9cbb --- /dev/null +++ b/tools/testing/nvdimm/test/ndtest.h @@ -0,0 +1,109 @@ +/* SPDX-License-Identifier: GPL-2.0-only */ +#ifndef NDTEST_H +#define NDTEST_H + +#include <linux/platform_device.h> +#include <linux/libnvdimm.h> + +/* SCM device is unable to persist memory contents */ +#define PAPR_PMEM_UNARMED (1ULL << (63 - 0)) +/* SCM device failed to persist memory contents */ +#define PAPR_PMEM_SHUTDOWN_DIRTY (1ULL << (63 - 1)) +/* SCM device contents are not persisted from previous IPL */ +#define PAPR_PMEM_EMPTY (1ULL << (63 - 3)) +#define PAPR_PMEM_HEALTH_CRITICAL (1ULL << (63 - 4)) +/* SCM device will be garded off next IPL due to failure */ +#define PAPR_PMEM_HEALTH_FATAL (1ULL << (63 - 5)) +/* SCM contents cannot persist due to current platform health status */ +#define PAPR_PMEM_HEALTH_UNHEALTHY (1ULL << (63 - 6)) + +/* Bits status indicators for health bitmap indicating unarmed dimm */ +#define PAPR_PMEM_UNARMED_MASK (PAPR_PMEM_UNARMED | \ + PAPR_PMEM_HEALTH_UNHEALTHY) + +#define PAPR_PMEM_SAVE_FAILED (1ULL << (63 - 10)) + +/* Bits status indicators for health bitmap indicating unflushed dimm */ +#define PAPR_PMEM_BAD_SHUTDOWN_MASK (PAPR_PMEM_SHUTDOWN_DIRTY) + +/* Bits status indicators for health bitmap indicating unrestored dimm */ +#define PAPR_PMEM_BAD_RESTORE_MASK (PAPR_PMEM_EMPTY) + +/* Bit status indicators for smart event notification */ +#define PAPR_PMEM_SMART_EVENT_MASK (PAPR_PMEM_HEALTH_CRITICAL | \ + PAPR_PMEM_HEALTH_FATAL | \ + PAPR_PMEM_HEALTH_UNHEALTHY) + +#define PAPR_PMEM_SAVE_MASK (PAPR_PMEM_SAVE_FAILED) + +struct ndtest_config; + +struct ndtest_priv { + struct platform_device pdev; + struct device_node *dn; + struct list_head resources; + struct nvdimm_bus_descriptor bus_desc; + struct nvdimm_bus *bus; + struct ndtest_config *config; + + dma_addr_t *dcr_dma; + dma_addr_t *label_dma; + dma_addr_t *dimm_dma; +}; + +struct ndtest_blk_mmio { + void __iomem *base; + u64 size; + u64 base_offset; + u32 line_size; + u32 num_lines; + u32 table_size; +}; + +struct ndtest_dimm { + struct device *dev; + struct nvdimm *nvdimm; + struct ndtest_blk_mmio *mmio; + struct nd_region *blk_region; + + dma_addr_t address; + unsigned long long flags; + unsigned long config_size; + void *label_area; + char *uuid_str; + + unsigned int size; + unsigned int handle; + unsigned int fail_cmd; + unsigned int physical_id; + unsigned int num_formats; + int id; + int fail_cmd_code; + u8 no_alias; +}; + +struct ndtest_mapping { + u64 start; + u64 size; + u8 position; + u8 dimm; +}; + +struct ndtest_region { + struct nd_region *region; + struct ndtest_mapping *mapping; + u64 size; + u8 type; + u8 num_mappings; + u8 range_index; +}; + +struct ndtest_config { + struct ndtest_dimm *dimms; + struct ndtest_region *regions; + unsigned int dimm_count; + unsigned int dimm_start; + u8 num_regions; +}; + +#endif /* NDTEST_H */ |