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.TH "libnvme" 9 "struct nvme_self_test_log" "November 2024" "API Manual" LINUX
.SH NAME
struct nvme_self_test_log \- Device Self-test (Log Identifier 06h)
.SH SYNOPSIS
struct nvme_self_test_log {
.br
.BI " __u8 current_operation;"
.br
.BI " __u8 completion;"
.br
.BI " __u8 rsvd[2];"
.br
.BI " struct nvme_st_result result[NVME_LOG_ST_MAX_RESULTS];"
.br
.BI "
};
.br
.SH Members
.IP "current_operation" 12
Current Device Self-Test Operation: indicates the status
of the current device self-test operation. If a device
self-test operation is in process (i.e., this field is set
to #NVME_ST_CURR_OP_SHORT or #NVME_ST_CURR_OP_EXTENDED),
then the controller shall not set this field to
#NVME_ST_CURR_OP_NOT_RUNNING until a new Self-test Result
Data Structure is created (i.e., if a device self-test
operation completes or is aborted, then the controller
shall create a Self-test Result Data Structure prior to
setting this field to #NVME_ST_CURR_OP_NOT_RUNNING).
See \fIenum nvme_st_curr_op\fP.
.IP "completion" 12
Current Device Self-Test Completion: indicates the percentage
of the device self-test operation that is complete (e.g.,
a value of 25 indicates that 25% of the device self-test
operation is complete and 75% remains to be tested).
If the \fIcurrent_operation\fP field is cleared to
#NVME_ST_CURR_OP_NOT_RUNNING (indicating there is no device
self-test operation in progress), then this field is ignored.
.IP "rsvd" 12
Reserved
.IP "result" 12
Self-test Result Data Structures, see \fIstruct nvme_st_result\fP.
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