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diff --git a/Documentation/nvme-virtium-save-smart-to-vtview-log.txt b/Documentation/nvme-virtium-save-smart-to-vtview-log.txt new file mode 100755 index 0000000..3e27b7e --- /dev/null +++ b/Documentation/nvme-virtium-save-smart-to-vtview-log.txt @@ -0,0 +1,84 @@ +nvme-virtium-save-smart-to-vtview-log(1) +======================================== + +NAME +---- +nvme-virtium-save-smart-to-vtview-log - Periodically save smart attributes into a log file (csv format). + +SYNOPSIS +-------- +[verse] +'nvme virtium save-smart-to-vtview-log' <device> [--run-time=<NUM> | -r <NUM>] + [--freq=<NUM> | -f <NUM>] + [--output-file=<FILE> | -o <FILE>] + [--test-name=<NAME> | -n <NAME>] + +DESCRIPTION +----------- +This command automates the process of collecting SMART data periodically and +saving the data in a ready-to-analyze format. Each entry is saved +with timestamp and in csv format. Users can use excel to analyze the data. +Some examples of use cases are collecting SMART data for temperature characterization, +collecting data to calculate endurance, or collecting SMART data during a test +or during normal operation. + +The <device> parameter is mandatory and may be either the NVMe character +device (ex: /dev/nvme0), or a namespace block device (ex: /dev/nvme0n1). + +On success, the command generates a log file, which contains an entry for identify device +(current features & settings) and periodic entries of SMART data. + +This command runs for the time specified by the option <run-time>, and collects SMART data +at the frequency specified by the option <freq>. If the output file name is not specified, +this command will generate a file name that include model string and serial number of the device. + +If the test-name option is specified, it will be recorded in the log file and be used as part +of the log file name. + +OPTIONS +------- +-r <NUM>:: +--run-tim=<NUM>:: + (optional) Number of hours to log data (default = 20 hours) + +-f <NUM>:: +--freq=<NUM>:: + (optional) How often you want to log SMART data + (0.25 = 15' , 0.5 = 30' , 1 = 1 hour, 2 = 2 hours, etc.). Default = 10 hours. + +-o <FILE>:: +--output-file=<FILE>:: + (optional) Name of the log file (give it a name that easy for you to remember + what the test is). You can leave it blank too, the file name will be generated + as <model string>-<serial number>-<test name>.txt. + +-n <NAME>:: +--test-name=<NAME>:: + (optional) Name of the test you are doing. We use this string as part of the name of the log file. + + +EXAMPLES +-------- +* Temperature characterization: ++ +------------ +# nvme virtium save-smart-to-vtview-log /dev/yourDevice --run-time=100 --record-frequency=0.25 --test-name=burn-in-at-(-40) +------------ ++ + +* Endurance testing: ++ +------------ +# nvme virtium save-smart-to-vtview-log /dev/yourDevice --run-time=100 --record-frequency=1 --test-name=Endurance-test-JEDEG-219-workload +------------ ++ + +* Just logging: Default logging is run for 20 hours and log every 10 hours. ++ +------------ +# nvme virtium save-smart-to-vtview-log /dev/yourDevice +------------ + +NVME +---- +Part of the nvme-user suite |