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'\" t
.\" Title: nvme-micron-smart-add-log
.\" Author: [FIXME: author] [see http://www.docbook.org/tdg5/en/html/author]
.\" Generator: DocBook XSL Stylesheets vsnapshot <http://docbook.sf.net/>
.\" Date: 08/02/2024
.\" Manual: NVMe Manual
.\" Source: NVMe
.\" Language: English
.\"
.TH "NVME\-MICRON\-SMART\" "1" "08/02/2024" "NVMe" "NVMe Manual"
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.nh
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.SH "NAME"
nvme-micron-smart-add-log \- Retrieves NAND statistics (2200 model drives) or Extended SMART information (OCP complaint models) of given micron device
.SH "SYNOPSIS"
.sp
.nf
\fInvme micron vs\-smart\-add\-log\fR <device> \-f <json|normal>
.fi
.SH "DESCRIPTION"
.sp
This command prints NAND information (Total bytes written, Bad block count and Erase failures etc) for the given micron device if its of 2200 model controller\&. For OCP complaint controllers this command print extended SMART health data along with NAND information (if available)
.sp
The <device> parameter is mandatory and may be either the NVMe character device (ex: /dev/nvme0), or a namespace block device (ex: /dev/nvme0n1)\&.
.sp
The \fI\-f\fR option controls the displayed output data format based on the option value\&. If the option value is \fIjson\fR (which is enabled by default), output data is printed in JSON format\&. If option value is \fInormal\fR the output is displayed in non\-JSON format\&.
.sp
This will only work on Micron devices devices of model numbers 54XX and OCP complaint controllers\&. Support for new devices may be added subsequently\&.
.SH "OPTIONS"
.PP
\-f <json|normal>
.RS 4
Controls the format of displayed output\&.
.RE
.SH "EXAMPLES"
.sp
.RS 4
.ie n \{\
\h'-04'\(bu\h'+03'\c
.\}
.el \{\
.sp -1
.IP \(bu 2.3
.\}
Retrieve NAND/extended SMART data and display in json format
.sp
.if n \{\
.RS 4
.\}
.nf
# nvme micron vs\-nand\-stats /dev/nvme0
* Retrieve NAND/extended SMART data and display in non\-json format
+
.fi
.if n \{\
.RE
.\}
.RE
.sp
# nvme micron vs\-nand\-stats /dev/nvme0 \-f normal
.sp
.if n \{\
.RS 4
.\}
.nf
NVME
.fi
.if n \{\
.RE
.\}
.sp
Part of the nvme\-user suite
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